Analysis of the degradation mechanism of ITO-free organic solar cells under UV radiation
Identifieur interne : 000196 ( Main/Repository ); précédent : 000195; suivant : 000197Analysis of the degradation mechanism of ITO-free organic solar cells under UV radiation
Auteurs : RBID : Pascal:14-0046849Descripteurs français
- Pascal (Inist)
- Endommagement, Dégradation, Addition étain, Cellule solaire organique, Rayonnement UV, Hétérojonction, Atmosphère ambiante, Grille métallique, Eclairement, Facteur remplissage, Courant court circuit, Etude expérimentale, Résistivité couche, Etude comparative, Mesure tension électrique, Mobilité porteur charge, Simulation numérique, Cellule solaire, Evaluation performance, Métallisation, Long terme, Oxyde d'indium, Thiophène dérivé polymère, Styrènesulfonate polymère, Mélange polymère, Fullerènes, Acide butyrique, Ester, Composé du fullerène, Oxyde de zinc, ITO, C60, ZnO.
English descriptors
- KwdEn :
- Ambient atmosphere, Butyric acid, Charge carrier mobility, Comparative study, Damaging, Degradation, Ester, Experimental study, Fill factor, Fullerene compounds, Fullerenes, Heterojunction, Illumination, Indium oxide, Long term, Metal grid, Metallizing, Numerical simulation, Organic solar cells, Performance evaluation, Polymer blends, Sheet resistivity, Short circuit currents, Solar cell, Styrenesulfonate polymer, Thiophene derivative polymer, Tin addition, Ultraviolet radiation, Voltage measurement, Zinc oxide.
Abstract
This work reports on the stability of encapsulated ITO-free bulk heterojunction organic solar cells (BHJ-OSC) under UV radiation in ambient air with the layer sequence Cr/Al/Cr/photoactive layer (PAL)/ poly (3, 4-ethylenedioxythiophene) poly (styrenesulfonate) (PEDOT:PSS)/metal-grid. The PAL consisted of poly(3-hexylthiophene) (P3HT) as a donor and (6,6)-phenyl-C60 butyric acid methyl ester (PCBM) as an acceptor. BHJ-OSC with this setup showed remarkable stability under continuous illumination (1000 W/ m2) with a low UV content. In contrast, the devices degraded significantly under UV radiation which was characterized by a reduction in fill factor and short-circuit current density. Additional experiments revealed an increase of the sheet resistance of the PEDOT:PSS layer which was interestingly much more pronounced in pure PEDOT:PSS samples as compared to samples where a PAL was deposited underneath. In addition, current extraction by linear increasing voltage (CELIV) measurements indicated a decrease of the effective charge carrier mobility of the PAL. Numerical simulations based on the experimentally determined parameters showed good agreement of the solar cell performance as a function of UV exposure duration. This suggests that the increase of the sheet resistance of the polymeric hole contact and to a lesser extent the change of the effective mobility of the PAL are the main factors governing the deterioration of the photovoltaic performance upon UV exposure. A comparison to devices with a setup ITO/ZnO/PAL/PEDOT:PSS and a full metallization showed clearly improved UV stability, although the absorption of UV in the PAL is very similar. This further supports our interpretation that the degradation of the PAL plays a very minor role. The issue with the degradation of the PEDOT:PSS can easily be solved by incorporating an UV-filter into the device or preferably the use of UV-stabilized PEDOT:PSS formulations.
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Ambient atmosphere</term>
<term>Butyric acid</term>
<term>Charge carrier mobility</term>
<term>Comparative study</term>
<term>Damaging</term>
<term>Degradation</term>
<term>Ester</term>
<term>Experimental study</term>
<term>Fill factor</term>
<term>Fullerene compounds</term>
<term>Fullerenes</term>
<term>Heterojunction</term>
<term>Illumination</term>
<term>Indium oxide</term>
<term>Long term</term>
<term>Metal grid</term>
<term>Metallizing</term>
<term>Numerical simulation</term>
<term>Organic solar cells</term>
<term>Performance evaluation</term>
<term>Polymer blends</term>
<term>Sheet resistivity</term>
<term>Short circuit currents</term>
<term>Solar cell</term>
<term>Styrenesulfonate polymer</term>
<term>Thiophene derivative polymer</term>
<term>Tin addition</term>
<term>Ultraviolet radiation</term>
<term>Voltage measurement</term>
<term>Zinc oxide</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Endommagement</term>
<term>Dégradation</term>
<term>Addition étain</term>
<term>Cellule solaire organique</term>
<term>Rayonnement UV</term>
<term>Hétérojonction</term>
<term>Atmosphère ambiante</term>
<term>Grille métallique</term>
<term>Eclairement</term>
<term>Facteur remplissage</term>
<term>Courant court circuit</term>
<term>Etude expérimentale</term>
<term>Résistivité couche</term>
<term>Etude comparative</term>
<term>Mesure tension électrique</term>
<term>Mobilité porteur charge</term>
<term>Simulation numérique</term>
<term>Cellule solaire</term>
<term>Evaluation performance</term>
<term>Métallisation</term>
<term>Long terme</term>
<term>Oxyde d'indium</term>
<term>Thiophène dérivé polymère</term>
<term>Styrènesulfonate polymère</term>
<term>Mélange polymère</term>
<term>Fullerènes</term>
<term>Acide butyrique</term>
<term>Ester</term>
<term>Composé du fullerène</term>
<term>Oxyde de zinc</term>
<term>ITO</term>
<term>C60</term>
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<front><div type="abstract" xml:lang="en">This work reports on the stability of encapsulated ITO-free bulk heterojunction organic solar cells (BHJ-OSC) under UV radiation in ambient air with the layer sequence Cr/Al/Cr/photoactive layer (PAL)/ poly (3, 4-ethylenedioxythiophene) poly (styrenesulfonate) (PEDOT:PSS)/metal-grid. The PAL consisted of poly(3-hexylthiophene) (P3HT) as a donor and (6,6)-phenyl-C<sub>60</sub>
butyric acid methyl ester (PCBM) as an acceptor. BHJ-OSC with this setup showed remarkable stability under continuous illumination (1000 W/ m<sup>2</sup>
) with a low UV content. In contrast, the devices degraded significantly under UV radiation which was characterized by a reduction in fill factor and short-circuit current density. Additional experiments revealed an increase of the sheet resistance of the PEDOT:PSS layer which was interestingly much more pronounced in pure PEDOT:PSS samples as compared to samples where a PAL was deposited underneath. In addition, current extraction by linear increasing voltage (CELIV) measurements indicated a decrease of the effective charge carrier mobility of the PAL. Numerical simulations based on the experimentally determined parameters showed good agreement of the solar cell performance as a function of UV exposure duration. This suggests that the increase of the sheet resistance of the polymeric hole contact and to a lesser extent the change of the effective mobility of the PAL are the main factors governing the deterioration of the photovoltaic performance upon UV exposure. A comparison to devices with a setup ITO/ZnO/PAL/PEDOT:PSS and a full metallization showed clearly improved UV stability, although the absorption of UV in the PAL is very similar. This further supports our interpretation that the degradation of the PAL plays a very minor role. The issue with the degradation of the PEDOT:PSS can easily be solved by incorporating an UV-filter into the device or preferably the use of UV-stabilized PEDOT:PSS formulations.</div>
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<fA08 i1="01" i2="1" l="ENG"><s1>Analysis of the degradation mechanism of ITO-free organic solar cells under UV radiation</s1>
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<fC01 i1="01" l="ENG"><s0>This work reports on the stability of encapsulated ITO-free bulk heterojunction organic solar cells (BHJ-OSC) under UV radiation in ambient air with the layer sequence Cr/Al/Cr/photoactive layer (PAL)/ poly (3, 4-ethylenedioxythiophene) poly (styrenesulfonate) (PEDOT:PSS)/metal-grid. The PAL consisted of poly(3-hexylthiophene) (P3HT) as a donor and (6,6)-phenyl-C<sub>60</sub>
butyric acid methyl ester (PCBM) as an acceptor. BHJ-OSC with this setup showed remarkable stability under continuous illumination (1000 W/ m<sup>2</sup>
) with a low UV content. In contrast, the devices degraded significantly under UV radiation which was characterized by a reduction in fill factor and short-circuit current density. Additional experiments revealed an increase of the sheet resistance of the PEDOT:PSS layer which was interestingly much more pronounced in pure PEDOT:PSS samples as compared to samples where a PAL was deposited underneath. In addition, current extraction by linear increasing voltage (CELIV) measurements indicated a decrease of the effective charge carrier mobility of the PAL. Numerical simulations based on the experimentally determined parameters showed good agreement of the solar cell performance as a function of UV exposure duration. This suggests that the increase of the sheet resistance of the polymeric hole contact and to a lesser extent the change of the effective mobility of the PAL are the main factors governing the deterioration of the photovoltaic performance upon UV exposure. A comparison to devices with a setup ITO/ZnO/PAL/PEDOT:PSS and a full metallization showed clearly improved UV stability, although the absorption of UV in the PAL is very similar. This further supports our interpretation that the degradation of the PAL plays a very minor role. The issue with the degradation of the PEDOT:PSS can easily be solved by incorporating an UV-filter into the device or preferably the use of UV-stabilized PEDOT:PSS formulations.</s0>
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<s5>11</s5>
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<s5>11</s5>
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<s5>13</s5>
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<s5>13</s5>
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<s5>17</s5>
</fC03>
<fC03 i1="17" i2="X" l="ENG"><s0>Numerical simulation</s0>
<s5>17</s5>
</fC03>
<fC03 i1="17" i2="X" l="SPA"><s0>Simulación numérica</s0>
<s5>17</s5>
</fC03>
<fC03 i1="18" i2="X" l="FRE"><s0>Cellule solaire</s0>
<s5>18</s5>
</fC03>
<fC03 i1="18" i2="X" l="ENG"><s0>Solar cell</s0>
<s5>18</s5>
</fC03>
<fC03 i1="18" i2="X" l="SPA"><s0>Célula solar</s0>
<s5>18</s5>
</fC03>
<fC03 i1="19" i2="X" l="FRE"><s0>Evaluation performance</s0>
<s5>19</s5>
</fC03>
<fC03 i1="19" i2="X" l="ENG"><s0>Performance evaluation</s0>
<s5>19</s5>
</fC03>
<fC03 i1="19" i2="X" l="SPA"><s0>Evaluación prestación</s0>
<s5>19</s5>
</fC03>
<fC03 i1="20" i2="X" l="FRE"><s0>Métallisation</s0>
<s5>20</s5>
</fC03>
<fC03 i1="20" i2="X" l="ENG"><s0>Metallizing</s0>
<s5>20</s5>
</fC03>
<fC03 i1="20" i2="X" l="SPA"><s0>Metalización</s0>
<s5>20</s5>
</fC03>
<fC03 i1="21" i2="X" l="FRE"><s0>Long terme</s0>
<s5>21</s5>
</fC03>
<fC03 i1="21" i2="X" l="ENG"><s0>Long term</s0>
<s5>21</s5>
</fC03>
<fC03 i1="21" i2="X" l="SPA"><s0>Largo plazo</s0>
<s5>21</s5>
</fC03>
<fC03 i1="22" i2="X" l="FRE"><s0>Oxyde d'indium</s0>
<s5>22</s5>
</fC03>
<fC03 i1="22" i2="X" l="ENG"><s0>Indium oxide</s0>
<s5>22</s5>
</fC03>
<fC03 i1="22" i2="X" l="SPA"><s0>Indio óxido</s0>
<s5>22</s5>
</fC03>
<fC03 i1="23" i2="X" l="FRE"><s0>Thiophène dérivé polymère</s0>
<s2>NK</s2>
<s5>23</s5>
</fC03>
<fC03 i1="23" i2="X" l="ENG"><s0>Thiophene derivative polymer</s0>
<s2>NK</s2>
<s5>23</s5>
</fC03>
<fC03 i1="23" i2="X" l="SPA"><s0>Tiofeno derivado polímero</s0>
<s2>NK</s2>
<s5>23</s5>
</fC03>
<fC03 i1="24" i2="X" l="FRE"><s0>Styrènesulfonate polymère</s0>
<s2>NK</s2>
<s5>24</s5>
</fC03>
<fC03 i1="24" i2="X" l="ENG"><s0>Styrenesulfonate polymer</s0>
<s2>NK</s2>
<s5>24</s5>
</fC03>
<fC03 i1="24" i2="X" l="SPA"><s0>Estireno sulfonato polímero</s0>
<s2>NK</s2>
<s5>24</s5>
</fC03>
<fC03 i1="25" i2="3" l="FRE"><s0>Mélange polymère</s0>
<s5>25</s5>
</fC03>
<fC03 i1="25" i2="3" l="ENG"><s0>Polymer blends</s0>
<s5>25</s5>
</fC03>
<fC03 i1="26" i2="X" l="FRE"><s0>Fullerènes</s0>
<s5>26</s5>
</fC03>
<fC03 i1="26" i2="X" l="ENG"><s0>Fullerenes</s0>
<s5>26</s5>
</fC03>
<fC03 i1="27" i2="X" l="FRE"><s0>Acide butyrique</s0>
<s2>NK</s2>
<s5>27</s5>
</fC03>
<fC03 i1="27" i2="X" l="ENG"><s0>Butyric acid</s0>
<s2>NK</s2>
<s5>27</s5>
</fC03>
<fC03 i1="27" i2="X" l="SPA"><s0>Butírico ácido</s0>
<s2>NK</s2>
<s5>27</s5>
</fC03>
<fC03 i1="28" i2="X" l="FRE"><s0>Ester</s0>
<s5>28</s5>
</fC03>
<fC03 i1="28" i2="X" l="ENG"><s0>Ester</s0>
<s5>28</s5>
</fC03>
<fC03 i1="28" i2="X" l="SPA"><s0>Ester</s0>
<s5>28</s5>
</fC03>
<fC03 i1="29" i2="3" l="FRE"><s0>Composé du fullerène</s0>
<s5>29</s5>
</fC03>
<fC03 i1="29" i2="3" l="ENG"><s0>Fullerene compounds</s0>
<s5>29</s5>
</fC03>
<fC03 i1="30" i2="X" l="FRE"><s0>Oxyde de zinc</s0>
<s5>30</s5>
</fC03>
<fC03 i1="30" i2="X" l="ENG"><s0>Zinc oxide</s0>
<s5>30</s5>
</fC03>
<fC03 i1="30" i2="X" l="SPA"><s0>Zinc óxido</s0>
<s5>30</s5>
</fC03>
<fC03 i1="31" i2="X" l="FRE"><s0>ITO</s0>
<s4>INC</s4>
<s5>82</s5>
</fC03>
<fC03 i1="32" i2="X" l="FRE"><s0>C60</s0>
<s4>INC</s4>
<s5>83</s5>
</fC03>
<fC03 i1="33" i2="X" l="FRE"><s0>ZnO</s0>
<s4>INC</s4>
<s5>84</s5>
</fC03>
<fN21><s1>055</s1>
</fN21>
<fN44 i1="01"><s1>OTO</s1>
</fN44>
<fN82><s1>OTO</s1>
</fN82>
</pA>
</standard>
</inist>
</record>
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